Published August 31, 2017 | Version v1
Journal article Metadata-only

Surface microstructures and corrosion resistance of Ni-Ti-Nb shape memory thin films

Creators

  • 1. Faculty of Engineering and Environment, Northumbria University, Newcastle Upon Tyne NE1 8ST (United Kingdom)
  • 2. Beijing Key Laboratory for Advanced Functional Materials and Thin Film Technology, Beihang University, Beijing 100191 (China)
  • 3. School of Materials Science and Engineering, Beihang University, Beijing 100191 (China)
  • 4. Memry Corporation, Bethel, CT 06801 (United States)
  • 5. Institute of Thin Films, Sensors & Imaging, Scottish Universities Physics Alliance, University of the West of Scotland, Paisley PA1 2BE (United Kingdom)

Description

Highlights: • The corrosion resistance of Ni-Ti-Nb shape memory thin films is investigated. • Modified surface oxide layers improve the corrosion resistance of Ni-Ti-Nb films. • Further Nb additions reduce the potential corrosion tendency of the films. - Abstract: Ni-Ti-Nb and Ni-Ti shape memory thin films were sputter-deposited onto silicon substrates and annealed at 600 °C for crystallization. X-ray diffraction (XRD) measurements indicated that all of the annealed Ni-Ti-Nb films were composed of crystalline Ni-Ti (Nb) and Nb-rich grains. X-ray photoelectron spectroscopy (XPS) tests showed that the surfaces of Ni-Ti-Nb films were covered with Ti oxides, NiO and Nb2O5. The corrosion resistance of the Ni-Ti-Nb films in 3.5 wt.% NaCl solution was investigated using electrochemical tests such as open-circuit potential (OCP) and potentio-dynamic polarization tests. Ni-Ti-Nb films showed higher OCPs, higher corrosion potentials (Ecorr) and lower corrosion current densities (icorr) than the binary Ni-Ti film, which indicated a better corrosion resistance. The reason may be that Nb additions modified the passive layer on the film surface. The OCPs of Ni-Ti-Nb films increased with further Nb additions, whereas no apparent difference of Ecorr and icorr was found among the Ni-Ti-Nb films.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2017.04.070

Additional details

Identifiers

DOI
10.1016/j.apsusc.2017.04.070;
PII
S0169-4332(17)31086-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
414
Journal Page Range
p. 63-67
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48078342
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANNEALING; CORROSION RESISTANCE; CRYSTALLIZATION; CURRENT DENSITY; ELECTROCHEMISTRY; LAYERS; MICROSTRUCTURE; NICKEL COMPOUNDS; NICKEL OXIDES; NIOBIUM COMPOUNDS; NIOBIUM OXIDES; POLARIZATION; SHAPE MEMORY EFFECT; SUBSTRATES; SURFACES; TERNARY ALLOY SYSTEMS; THIN FILMS; TITANIUM COMPOUNDS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
ALLOY SYSTEMS; CHALCOGENIDES; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; FILMS; HEAT TREATMENTS; NICKEL COMPOUNDS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTOELECTRON SPECTROSCOPY; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.