Published November 2003
| Version v1
Journal article
Jem-X: the X-ray monitor aboard Integral
- 1. Danish Space Research Institute, Copenhagen (Denmark)
Description
The JEM-X monitor provides X-ray spectra and imaging with arc-minute angular resolution in the 3 to 35 keV band. The good angular resolution and the low energy response of JEM-X plays an important role in the identification of gamma ray sources and in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture instrument consisting of two identical, aligned telescopes. Each of the detectors has a sensitive area of 500 cm2, and views the sky through its own coded aperture mask. The two coded masks are inverted with respect to each other and provides an angular resolution of 3 minutes across an effective field of view of about 10 degrees diameter. (authors)
Additional details
Publishing Information
- Journal Title
- Astronomy and Astrophysics
- Journal Volume
- 411
- Journal Issue
- no.1
- Journal Page Range
- p. L231-L238
- ISSN
- 0004-6361
- CODEN
- AAEJAF
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 35051063
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; COSMIC PHOTONS; ENERGY RESOLUTION; GAMMA DETECTION; GAMMA SPECTROMETERS; PERFORMANCE; X RADIATION
- Descriptors DEC
- BOSONS; COSMIC RADIATION; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; PHOTONS; RADIATION DETECTION; RADIATIONS; RESOLUTION; SPECTROMETERS
Optional Information
- Notes
- 18 refs.