Published November 2003 | Version v1
Journal article

Jem-X: the X-ray monitor aboard Integral

  • 1. Danish Space Research Institute, Copenhagen (Denmark)

Description

The JEM-X monitor provides X-ray spectra and imaging with arc-minute angular resolution in the 3 to 35 keV band. The good angular resolution and the low energy response of JEM-X plays an important role in the identification of gamma ray sources and in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture instrument consisting of two identical, aligned telescopes. Each of the detectors has a sensitive area of 500 cm2, and views the sky through its own coded aperture mask. The two coded masks are inverted with respect to each other and provides an angular resolution of 3 minutes across an effective field of view of about 10 degrees diameter. (authors)

Additional details

Publishing Information

Journal Title
Astronomy and Astrophysics
Journal Volume
411
Journal Issue
no.1
Journal Page Range
p. L231-L238
ISSN
0004-6361
CODEN
AAEJAF

Optional Information

Notes
18 refs.