Published April 1, 1978
| Version v1
Journal article
Measurement of stopping powers using ion-induced X-ray emission
Description
Stopping powers of 100 keV protons in thin films of Sc, Ni, Cu, and Ge which have been vacuum evaporated on thick substrates are measured by observung the characteristic X-rays generated in the substrate. The condition of the stopping film is monitored simultaneously with the collection of stopping power data by the detection of characteristic X-ray emission from the stopping film. (Auth.)
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 150
- Journal Issue
- 2
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 241-245
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 9389861
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COPPER; EFFICIENCY; ENERGY LOSSES; GERMANIUM; KEV RANGE 100-1000; LI-DRIFTED SI DETECTORS; MEASURING METHODS; MICRO AMP BEAM CURRENTS; NICKEL; PROTON BEAMS; SCANDIUM; STOPPING POWER; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- BEAM CURRENTS; BEAMS; CHEMICAL ANALYSIS; CURRENTS; ELEMENTS; ENERGY RANGE; KEV RANGE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent