Published February 1, 2006 | Version v1
Journal article

Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

  • 1. Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505 (Japan)
  • 2. United Nation University, 5-53-70 Gingumae, Shibuya-ku, Tokyo 150-8925 (Japan)
  • 3. Idemitsu Kosan, Co., Ltd., 1280 Kamiizumi, Sodegaura-shi, Chiba 299-0293 (Japan)
  • 4. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5198 (Japan)

Description

Grazing incidence X-ray scattering (GIXS) using synchrotron radiation is a very useful method for structural analysis of amorphous films. We investigated the structure of amorphous In2O3 film utilizing GIXS at BL19B2 in SPring-8. Radial distribution function (RDF) was obtained from the measurement data. Structural models were constructed by molecular dynamics (MD) and reverse Monte-Carlo (RMC) simulations, and the calculated RDFs from the simulations were compared with that observed. It was found that the average oxygen coordination number around In ions was almost 6 and the average length 2.12 A, which was smaller by about 3% than that of 2.18 A in crystalline In2O3. It was concluded that the atomic arrangement of the amorphous In2O3 was characterized by the increase in the number and the boarder angle of distribution of corner-sharing In-O-In bond compared with crystalline In2O3

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.08.256;
PII
S0040-6090(05)01505-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
496
Journal Issue
1
Journal Page Range
p. 95-98
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
4. international symposium on transparent oxide thin films for electronics and optics
Acronym
TOEO-4
Dates
7-8 Apr 2005
Place
Tokyo (Japan)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.