Published August 24, 2011 | Version v1
Journal article

Orthorhombic polar Nd-doped BiFeO3 thin film on MgO substrate

  • 1. Laboratoire Structures, Proprietes et Modelisation des Solides, UMR CNRS-Ecole Centrale Paris, 92295 Chatenay-Malabry Cedex (France)
  • 2. Faculty of Physics, Southern Federal University, Zorge 5, Rostov-on-Don 344090 (Russian Federation)
  • 3. Laboratoire de Physique de la Matiere Condensee, Universite de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens (France)
  • 4. Swiss-Norwegian Beam Lines at ESRF, Boite Postale 220, F-38043 Grenoble (France)
  • 5. Southern Scientific Center RAS, Rostov-on-Don, 344006 (Russian Federation)

Description

A Nd-doped BiFeO3 thin film deposited on MgO substrate was studied by synchrotron diffraction. The ferroelectric nature of the film is proven by in-plane remanent polarization measurement. The highest possible symmetry of the film is determined to be orthorhombic, within the Fm2m space group. Such a structure is rotated by 450 with respect to the substrate and is consistent with tilts of oxygen octahedra doubling the unit cell. This polar structure presents a rather unusual strain-accommodation mechanism. (fast track communication)

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/23/33/332201

Additional details

Identifiers

DOI
10.1088/0953-8984/23/33/332201;
PII
S0953-8984(11)92283-8;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
23
Journal Issue
33
Journal Page Range
[5 p.]
ISSN
0953-8984
CODEN
JCOMEL