Published 2005 | Version v1
Book

Swift heavy ion induced modifications in LiF thin films

  • 1. Dept.of Physics, Univ. of Allahabad, Allahabad (India)
  • 2. Nuclear Science Centre, New Delhi (India)
  • 3. Dept. of Physics, R.B.S. College, Agra (India)
  • 4. IUC-DAEF, University Campus, Indore (India)

Description

Thermally grown thin films of LiF were irradiated with 150 MeV Ag ions at various fluences. The quality of films was studied using GAXRD, which shows that films are c-axis oriented. It also shows that grain size decreases and the intensity of (200) orientation enhances with fluence, which is the preferential orientation. These results are further confirmed by photoluminescence studies, which shows that the concentration of F3+ and F2 color centers decreases with ion fluence due to increase in surface to volume ratio under Swift Heavy Ion (SHI) irradiation. (author)

Part of:
Proceedings of the DAE solid state physics symposium. V. 46

Additional details

Publishing Information

Publisher
Allied Publishers Private Ltd.
Imprint Place
New Delhi (India)
ISBN
81-7764-652-4
Imprint Title
Proceedings of the DAE solid state physics symposium. V. 46
Imprint Pagination
1053 p.
Journal Page Range
p. 501-502

Conference

Title
46. DAE solid state physics symposium
Dates
26-30 Dec 2003
Place
Gwalior (India)

Optional Information

Notes
5 refs., 3 figs., 1 tab.