Published March 31, 2003 | Version v1
Journal article

Imaging coherent electron flow in a two-dimensional electron gas

Description

Scanning probe microscopy (SPM) has been used to obtain images of electron flow through a two-dimensional electron gas from a quantum point contact (QPC) inside a GaAs/AlGaAs heterostructure at liquid He temperatures. A negatively charged SPM tip depletes the electron gas immediately below and decreases the conductance of the QPC by backscattering electrons. Images of electron flow are obtained by recording the conductance, as the tip is scanned across the structure. At distances less than 1 μm from the QPC, the electron flow shows angular lobes that are characteristic of the quantum modes of the QPC. At distances greater than 1 μm, well-defined branches of electron flow are observed that are caused by the cumulative effects of small angle scattering by ionized donor and impurity atoms. Interference fringes spaced by half the Fermi wavelength decorate all of the images of electron flow; their spacing gives a spatial profile of the electron density

Additional details

Identifiers

DOI
10.1016/S0169-4332(02)01493-9;
arXiv
arXiv:math/0411079v3;
PII
S0169433202014939;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
210
Journal Issue
1-2
Journal Page Range
p. 134-139
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
5. international conference on noncontact atomic force microscopy (AFM)
Acronym
NC-AFM 2002
Dates
11-14 Aug 2002
Place
Montreal (Canada)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38086471
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM ARSENIDES; BACKSCATTERING; ELECTRIC CONTACTS; ELECTRON DENSITY; ELECTRON GAS; ELECTRONS; GALLIUM ARSENIDES; IMPURITIES; INTERFERENCE; MICROSCOPY; SMALL ANGLE SCATTERING
Descriptors DEC
ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; ELECTRICAL EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; GALLIUM COMPOUNDS; LEPTONS; PNICTIDES; SCATTERING

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.