Published November 8, 2010 | Version v1
Journal article

High-quality epitaxial CoFe/Si(111) heterostructures fabricated by low-temperature molecular beam epitaxy

  • 1. Department of Electronics, Kyushu University, 744 Motooka, Fukuoka 819-0395 (Japan)
  • 2. PRESTO, Japan Science and Technology Agency, Sanbancho, Tokyo 102-0075 (Japan)

Description

We demonstrate atomically controlled heterojunctions consisting of ferromagnetic CoFe alloys and silicon (Si) using low-temperature molecular beam epitaxy with a good atomic matching at the (111) plane. The saturation magnetization of the CoFe layers grown reaches ∼85% of the value of bulk samples reported so far, and can be systematically controlled by tuning the ratio of Co to Fe, indicating that the silicidation reactions between CoFe and Si are suppressed and the heterojunctions are very high quality. We find that the Schottky barrier height of the high-quality CoFe/Si(111) junctions is unexpectedly low compared to the previous data for other metal/Si ones, implying the reduction in the Fermi-level-pinning effect. We can expand the available high-quality ferromagnet/Si heterostructures in the field of Si-based spintronics.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
97
Journal Issue
19
Journal Page Range
p. 192501-192501.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2010 American Institute of Physics