Published April 1984 | Version v1
Journal article Metadata-only

Electrical properties of Cu/PbTe thin film structures

Creators

  • 1. Moskovskij Inst. Ehlektronnoj Tekhniki (USSR)

Description

no abstract available

Additional details

Additional titles

Original title (Russian)
Электрофизические свойства тонкопленочных структур Cу/PbTe

Publishing Information

Journal Title
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Volume
20
Journal Issue
4
Series
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Page Range
684-685
ISSN
0002-337X

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
16013179
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
COPPER; ELECTRIC CONDUCTIVITY; ELECTRON DENSITY; ELECTRON MOBILITY; FILMS; GRAIN BOUNDARIES; LEAD TELLURIDES; SEMICONDUCTOR JUNCTIONS; THERMOELECTRIC PROPERTIES; THICKNESS; VAPOR DEPOSITED COATINGS
Descriptors DEC
CHALCOGENIDES; COATINGS; CRYSTAL STRUCTURE; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; LEAD COMPOUNDS; METALS; MICROSTRUCTURE; MOBILITY; PARTICLE MOBILITY; PHYSICAL PROPERTIES; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Notes
Short note. For English translation see the journal Inorganic Materials (USA).