Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer
Creators
- 1. Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE 68588-0511 (United States)
- 2. Biomolecular and Organic Electronics, Department of Physics, Chemistry and Biology (IFM), Linkoeping University, SE-581 83 Linkoeping (Sweden)
- 3. Laboratory of Applied Optics, Department of Physics, Chemistry and Biology (IFM), Linkoeping University, SE-581 83 Linkoeping (Sweden)
Description
Optical and structural properties of a hybrid metallic chevron sculptured thin film from titanium coated with the semiconducting polymer poly(3-dodecylthiophene) (P3DDT) are reported. The nanostructured thin film with two subsequent layers of oppositely slanted nanocolumns was fabricated by glancing angle deposition and coated with P3DDT by a spin-cast process. Spectroscopic generalized ellipsometry is employed to determine geometrical structure properties and the anisotropic optical constants of the coated and uncoated film in the spectral range from 400 to 1700 nm. The nanostructured thin films before and after hybridization show highly anisotropic optical properties. The complex refractive indices along major polarizability directions of the hybridized chevrons are increased in the entire investigated spectral range with respect to the as-deposited chevrons. Changes in birefringence and dichroism upon polymer infiltration are observed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2010.12.111Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2010.12.111;
- PII
- S0040-6090(10)01760-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 9
- Journal Page Range
- p. 2645-2649
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on spectroscopic ellipsometry
- Dates
- 23-28 May 2010
- Place
- Albany, NY (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42072109
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; BIREFRINGENCE; DEPOSITION; DICHROISM; ELLIPSOMETRY; HYBRIDIZATION; LAYERS; NANOSTRUCTURES; POLARIZABILITY; POLYMERS; REFRACTIVE INDEX; THIN FILMS; TITANIUM
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MEASURING METHODS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; REFRACTION; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.