Published October 2004
| Version v1
Journal article
X-ray imaging of an X-pinch plasma with a bubble compound refractive lens
Creators
- 1. Institute of Applied Physics Problems, Kurchatova 7, Minsk 220064 (Belarus)
- 2. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853 (United States)
- 3. Adelphi Technology, Inc., 981-B Industrial Road, San Carlos, California 94070 (United States)
Description
We present diagnostic images taken of an X-pinch plasma x-ray source driven by the XP pulser (100 ns, 500 kA) at Cornell University using an x-ray bubble compound refractive lens. The lens consists of a 200 μm inside diameter glass capillary that contains about 100 biconcave microlenses formed by a string of bubbles in epoxy. A precise system for lens alignment with of 3-5 arcmin accuracy is described. X-ray images of four-wire X pinches were obtained with a spatial resolution of approximately 2 μm
Additional details
Identifiers
- DOI
- 10.1063/1.1789252;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 10
- Journal Page Range
- p. 3950-3952
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 15. topical conference on high temperature plasma diagnostics
- Dates
- 19-22 Apr 2004
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36083164
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ALIGNMENT; BUBBLES; IMAGES; LENSES; OPTICS; PINCH EFFECT; PLASMA DIAGNOSTICS; SPATIAL RESOLUTION; X-RAY RADIOGRAPHY; X-RAY SOURCES
- Descriptors DEC
- INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATION SOURCES; RESOLUTION; TESTING
Optional Information
- Notes
- (c) 2004 American Institute of Physics