Development on structural analysis technology at low temperature and high pressure using synchrotron radiation

This study aims at experimentally making a system precisely measurable on crystal structure of a sample pressed by diamond anvil cell continuously variable on temperature and pressure at region of about 10 K and about 30 GPa, respectively, by using an imaging plate (IP) of two dimensional detector and synchrotron radiation beam as X-ray source to investigate change in behavior of various substances at low temperature with pressure. By reforming in 1998 fiscal year, the low temperature and high pressure experimental apparatus was finished for an executive system. Its experimental conditions were 30 GPa and 10 K in initial setting, where its pressure was contented without any trouble and its temperature could be steadily changed to 15 K. And, it could carry out clearer observation and pressure testing at low temperature than its forecast ones. The IP had no trouble because of its long experience, and by adding an executive off-line reader it could be widely upgraded its experimental In addition, an X-ray CCD camera for its rapid testing operated smoothly, and its image distortion could be reduced to no problem by using a software developed at ESRF. (G.K.)