Published June 2008
| Version v1
Journal article
Deep plasma etching of glass for fluidic devices with different mask materials
Creators
- 1. VTT, Espoo (Finland)
- 2. Micro and Nanosciences Laboratory, Espoo (Finland)
Description
Deep reactive ion etching (DRIE) processes have been developed for fabricating fluidic devices in glass (Pyrex(TM) and fused silica) substrates with cavities deeper than 100 µm. By using a standard silicon wafer as the etch mask, patterned by silicon DRIE, very deep and nearly vertical structures can be etched into the glass. In this work, an atmospheric pressure chemical ionization chip was fabricated. Also the results show potential for satisfactory etch characteristics with Ni, amorphous silicon (a-Si) and SU-8 as mask materials
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/18/6/064010Additional details
Identifiers
- DOI
- 10.1088/0960-1317/18/6/064010;
- PII
- S0960-1317(08)65185-2;
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 18
- Journal Issue
- 6
- Journal Page Range
- [6 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
Conference
- Title
- European workshop on micromechanics
- Acronym
- MME 07
- Dates
- 16-18 Sep 2007
- Place
- Guimaraes (Portugal)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44099549
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATMOSPHERIC PRESSURE; ETCHING; FLUIDIC DEVICES; IONIZATION; IONS; PYREX; SILICA; SILICON; SUBSTRATES
- Descriptors DEC
- BOROSILICATE GLASS; CHARGED PARTICLES; ELEMENTS; GLASS; MINERALS; OXIDE MINERALS; SEMIMETALS; SURFACE FINISHING