Published June 2008 | Version v1
Journal article

Deep plasma etching of glass for fluidic devices with different mask materials

  • 1. VTT, Espoo (Finland)
  • 2. Micro and Nanosciences Laboratory, Espoo (Finland)

Description

Deep reactive ion etching (DRIE) processes have been developed for fabricating fluidic devices in glass (Pyrex(TM) and fused silica) substrates with cavities deeper than 100 µm. By using a standard silicon wafer as the etch mask, patterned by silicon DRIE, very deep and nearly vertical structures can be etched into the glass. In this work, an atmospheric pressure chemical ionization chip was fabricated. Also the results show potential for satisfactory etch characteristics with Ni, amorphous silicon (a-Si) and SU-8 as mask materials

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/18/6/064010

Additional details

Identifiers

DOI
10.1088/0960-1317/18/6/064010;
PII
S0960-1317(08)65185-2;

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
18
Journal Issue
6
Journal Page Range
[6 p.]
ISSN
0960-1317
CODEN
JMMIEZ

Conference

Title
European workshop on micromechanics
Acronym
MME 07
Dates
16-18 Sep 2007
Place
Guimaraes (Portugal)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44099549
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATMOSPHERIC PRESSURE; ETCHING; FLUIDIC DEVICES; IONIZATION; IONS; PYREX; SILICA; SILICON; SUBSTRATES
Descriptors DEC
BOROSILICATE GLASS; CHARGED PARTICLES; ELEMENTS; GLASS; MINERALS; OXIDE MINERALS; SEMIMETALS; SURFACE FINISHING