Layered MoS2 grown on c-sapphire by pulsed laser deposition
Creators
- 1. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu (China)
- 2. Department of Electrophysics, National Chiao Tung University, Hsinchu (China)
- 3. Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu (China)
- 4. Department of Electronics Engineering, National Chiao Tung University, Hsinchu (China)
Description
Layered growth of molybdenum disulphide (MoS2) was successfully achieved by pulsed laser deposition (PLD) method on c -plane sapphire substrate. Growth of monolayer to a few monolayer MoS2, dependent on the pulsed number of excimer laser in PLD is demonstrated, indicating the promising controllability of layer growth. Among the samples with various pulse number deposition, the frequency difference (A1g-E12g) in Raman analysis of the 70 pulse sample is estimated as 20.11 cm-1, suggesting a monolayer MoS2 was obtained. Two-dimensional (2D) layer growth of MoS2 is confirmed by the streaky reflection high energy electron diffraction (RHEED) patterns during growth and the cross-sectional view of transmission electron microscopy (TEM). The in-plane relationship, (0006) sapphire//(0002)MoS2 and [2 anti 1 anti 10] sapphire//[0 anti 1 anti 10]MoS2 is determined. The results imply that PLD is suitable for layered MoS2 growth. Additionally, the oxide states of Mo 3d core level spectra of PLD grown MoS2, analysed by X-ray photoelectron spectroscopy (XPS), can be effectively reduced by adopting a post sulfurization process. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssr.201409561Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. Rapid Research Letters (Online)
- Journal Volume
- 9
- Journal Issue
- 3
- Journal Page Range
- p. 187-191
- ISSN
- 1862-6270
- CODEN
- PSSRCS
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46063199
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINDING ENERGY; BRAGG REFLECTION; CRYSTAL GROWTH; DEPOSITION; ELECTRON DIFFRACTION; ELECTRON SPECTRA; EMISSION SPECTRA; ENERGY SPECTRA; LASER RADIATION; LAYERS; MOLYBDENUM SULFIDES; PHOTOELECTRIC EMISSION; PULSED IRRADIATION; RAMAN SPECTRA; SAPPHIRE; SPECTRAL SHIFT; SUBSTRATES; SURFACES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CORUNDUM; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON EMISSION; ELECTRON MICROSCOPY; EMISSION; ENERGY; FILMS; IRRADIATION; MICROSCOPY; MINERALS; MOLYBDENUM COMPOUNDS; OXIDE MINERALS; PHOTOELECTRIC EFFECT; RADIATIONS; REFLECTION; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTRA; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS