Published November 1, 2004
| Version v1
Journal article
An experimental study on the ZnO/sapphire layered surface acoustic wave device
Creators
- 1. Institute of Applied Mechanics, National Taiwan University, Taipei, Taiwan (China)
Description
In this study, ZnO thin films with different thicknesses were deposited on C-plane sapphire substrates by radio-frequency magnetron sputtering. Properties of interdigital transducer/ZnO/sapphire layered surface acoustic wave device including surface wave velocity, electromechanical coupling coefficient, and propagatiion loss were measured and discussed. Combining the effective permittivity approach and the coupling-of-modes (COM) model, the dispersion characteristics and frequency responses of the ZnO/sapphire layered structure were simulated. By substituting the measured parameters into the COM model, the simulated frequency response has shown good agreement with the experimental results
Additional details
Identifiers
- DOI
- 10.1063/1.1785842;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 96
- Journal Issue
- 9
- Journal Page Range
- p. 5249-5253
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36100707
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; DIELECTRIC MATERIALS; MORPHOLOGY; PERMITTIVITY; PIEZOELECTRICITY; RADIOWAVE RADIATION; ROUGHNESS; SAPPHIRE; SEMICONDUCTOR MATERIALS; SOUND WAVES; SPUTTERING; SUBSTRATES; SURFACES; THICKNESS; THIN FILMS; TRANSDUCERS; WAVE PROPAGATION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CORUNDUM; DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRICITY; ELECTROMAGNETIC RADIATION; FILMS; MATERIALS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SURFACE PROPERTIES; ZINC COMPOUNDS
Optional Information
- Notes
- (c) 2004 American Institute of Physics