Published November 1993
| Version v1
Journal article
Development and use of electronic components for radiating environments
Creators
- 1. Dassault Electronique, 92 - Saint-Cloud (France)
- 2. Nucletudes, 91 - Les Ulis (France)
Description
In microelectronic, some technologies for components radiation hardening in various environments are presented: SOI (Silicon On Insulator), CMOS or SIMOX (Separation by Implantation of Oxygen). (A.B.)
Additional details
Additional titles
- Original title (French)
- Developpement et utilisation des composants electroniques soumis a un environnement radiatif
Publishing Information
- Journal Title
- Onde Electrique
- Journal Volume
- 73
- Journal Issue
- 6
- Journal Page Range
- p. 69-70.
- ISSN
- 0030-2430
- CODEN
- ONELAS
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 25022994
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- GAMMA RADIATION; HEAVY IONS; INTEGRATED CIRCUITS; MICROELECTRONIC CIRCUITS; MICROELECTRONICS; RADIATION HARDENING; X RADIATION
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; HARDENING; IONIZING RADIATIONS; IONS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; RADIATIONS