Observation of the Meyer–Neldel rule in nanocrystalline PbSe thin films
Creators
- 1. Semiconductors Technology Lab., Faculty of Science, Ain Shams University, Cairo -11566 (Egypt)
Description
In this paper, nanocrystalline lead selenide (nc-PbSe) thin films have been chemically deposited on glass substrates using appropriate chemical reagents in aqueous alkaline media. The structural, morphological, optical and electrical properties of PbSe thin films have been studied. X-ray diffraction (XRD) analysis indicates that these films have a cubic structure with an average grain size of ∼21 nm. The field emission scanning microscope (FE-SEM) micrograph shows that the films have a dense surface with a smooth granular structure and well-defined grain boundaries. The σ(T) measurements were carried out under vacuum over a wide temperature range (77–350 K) for nc-PbSe films with a thickness of 375 ± 10 nm. The temperature dependence of dark dc conductivity σ(T) in PbSe nanocrystalline (nc) thin films is found to obey the Meyer–Neldel rule (MNR). The MNR correlates the spread in the thermal activation energy of conduction (ΔE) with the exponential pre-factor (σ0) of the Arrhenius conductivity formula. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0031-8949/89/11/115805Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 89
- Journal Issue
- 11
- Journal Page Range
- [6 p.]
- ISSN
- 1402-4896
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46059363
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACTIVATION ENERGY; CRYSTALS; ELECTRICAL PROPERTIES; FIELD EMISSION; GLASS; GRAIN BOUNDARIES; GRAIN SIZE; LEAD SELENIDES; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; ENERGY; FILMS; LEAD COMPOUNDS; MICROSCOPY; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SIZE