Diffusion coefficients of indium and tin in In-Sn alloys determined by Auger electron spectroscopy using xenon ion bombardment

The paper reports the determination of diffusion coefficients of indium and tin in In-Sn alloys, by measurement of surface segregation kinetics. Xenon ion bombardment was used in conjunction with auger electron spectroscopy to determine the bulk composition of each alloy in situ. The effect of surface oxygen on the diffusion coefficient was also examined. (U.K.)