Interferometry and refraction measurements in plasmas of elliptical cross-section

The measurement of electron densities using interferometry and refraction measurements in plasmas with cross-sections where the electron density contours are concentric ellipses is examined. Transforms are found for both interferometrically deduced optical path-length differences and refraction angle data obtained from elliptical cross-section plasmas. The transformed data can be inverted to give electron densities using standard techniques developed for circular cross-section plasmas. Refraction of light in elliptical cross-section plasmas is examined using numerical ray tracing. (author)