The synthesis of twinned silicon carbide nanowires by a catalyst-free pyrolytic deposition technique
Creators
- 1. College of Science, Beihang University, Beijing 100083 (China)
- 2. College of Material Science and Engineering, Donghua University, Shanghai 201620 (China)
- 3. Equipment Academy of Second Artillery, Beijing 100085 (China)
Description
A catalyst-free pyrolytic deposition technique has been developed to synthesize twinned silicon carbide nanowires using tetraethoxysilane (TEOS) as the precursor. The morphology, structure and composition of the SiC nanowires were investigated by scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), selected-area electronic diffraction (SAED) and energy-dispersive x-ray spectroscopy (EDX). It was observed that high-density stacking faults and microtwins along their axis indexed as the [1 1 1] direction were present in the resulting SiC nanowires. A model was proposed to explain the formation of the SiC nanowires from decomposition of TEOS. It is believed that SiC nanowires were grown along the direction of [1 1 1].
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/14/145602Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/14/145602;
- PII
- S0957-4484(09)03938-5;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 14
- Journal Page Range
- [5 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41012415
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CATALYSTS; DECOMPOSITION; DEPOSITION; ELECTRON DIFFRACTION; MORPHOLOGY; QUANTUM WIRES; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; NANOSTRUCTURES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY