Preparation of thin films of carbon-based compounds
Description
We present the preparation and characterization of thin films of several carbon-based compounds. Boron carbide films were prepared by pulsed laser deposition (PLD) in vacuum using sintered B4C as raw material. In the environment of an ECR nitrogen plasma and with bombardment by the low-energy plasma stream, carbon nitride films were prepared by ablating a graphite target, while a sintered B4C target was used to prepare thin films of boron carbon nitride (BCN). The prepared films with smooth surface were found to be adhesive to the substrates and contain several chemical bonds with atomic hybridization rather than a simple mixture of B-N, B-C and C-N phases. Pulsed laser ablation of the target is efficient for the target material to be transferred to a nearby substrate. For nitride film preparation, the assistance of the reactive ECR nitrogen plasma is responsible for nitrogen incorporation and favorable for nitride formation
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(03)00622-6;
- arXiv
- arXiv:hep-lat/9607031v1;
- PII
- S0169433203006226;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 218
- Journal Issue
- 1-4
- Journal Page Range
- p. 298-305
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38089896
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BORON CARBIDES; CARBON NITRIDES; CHEMICAL BONDS; ELECTRON CYCLOTRON-RESONANCE; ENERGY BEAM DEPOSITION; GRAPHITE; LASER RADIATION; LASERS; NITROGEN; PULSED IRRADIATION; RAW MATERIALS; THIN FILMS
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON; CARBON COMPOUNDS; CYCLOTRON RESONANCE; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; MATERIALS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PNICTIDES; RADIATIONS; RESONANCE; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.