Published April 1, 1982 | Version v1
Journal article Metadata-only

The angular distribution parameters of argon, krypton and xenon for use in calibration of electron spectrometers

Creators

  • 1. Maryland Univ., College Park (USA). Inst. for Physical Science and Technology
  • 2. National Bureau of Standards, Washington, DC (USA)
  • 3. Argonne National Lab., IL (USA)
  • 4. Science Research Council, Daresbury (UK). Daresbury Lab.

Description

Measurements are presented of the angular distribution parameter for the photoejected valence electrons of argon, krypton and xenon, from threshold to hν approx. equal to 25 eV. The experimental arrangement at the NBS (SURF II) storage ring is described and the method of data analysis discussed. The results are compared with other experimental data and theoretical predictions. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
195
Journal Issue
1/2
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
331-337
ISSN
0029-554X

Conference

Title
2. national conference on synchrotron radiation instrumentation.
Dates
15 - 17 Jul 1981.
Place
Ithaca, NY, USA.

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
13700431
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ANGULAR DISTRIBUTION; ARGON; ASYMMETRY; CALIBRATION; ELECTRON SPECTROMETERS; ENERGY LEVELS; ENERGY SPECTRA; EXPERIMENTAL DATA; KRYPTON; PHOTOEMISSION; SYNCHROTRON RADIATION; THRESHOLD ENERGY; XENON
Descriptors DEC
BREMSSTRAHLUNG; DATA; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY; INFORMATION; MEASURING INSTRUMENTS; NONMETALS; NUMERICAL DATA; RADIATIONS; RARE GASES; SECONDARY EMISSION; SPECTRA; SPECTROMETERS