Systematic search for spherical crystal X-ray microscopes matching 1–25 keV spectral line sources
Creators
- 1. Sandia National Laboratory (SNL-NM), Albuquerque, NM (United States)
Description
Spherical-crystal microscopes are used as high-resolution imaging devices for monochromatic x-ray radiography or for imaging the source itself. Crystals and Miller indices (hkl) have to be matched such that the resulting lattice spacing d is close to half the spectral wavelength used for imaging, to fulfill the Bragg equation with a Bragg angle near 90° which reduces astigmatism. Only a few suitable crystal and spectral-line combinations have been identified for applications in the literature, suggesting that x-ray imaging using spherical crystals is constrained to a few chance matches. In this paper, after performing a systematic, automated search over more than 9 × 106 possible combinations for x-ray energies between 1 and 25 keV, for six crystals with arbitrary Miller-index combinations hkl between 0 and 20, we show that a matching, efficient crystal and spectral-line pair can be found for almost every Heα or Kα x-ray source for the elements Ne to Sn. Finally, using the data presented here it should be possible to find a suitable imaging combination using an x-ray source that is specifically selected for a particular purpose, instead of relying on the limited number of existing crystal imaging systems that have been identified to date.
Availability note (English)
Available from http://www.osti.gov/pages/biblio/1340260; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo periodAdditional details
Identifiers
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 87
- Journal Issue
- 12
- Journal Page Range
- vp.
- ISSN
- 0034-6748
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 48062764
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRAGG REFLECTION; CRYSTALS; KEV RANGE 01-10; KEV RANGE 10-100; MICROSCOPES; MILLER INDICES; NEON; TIN; X-RAY RADIOGRAPHY; X-RAY SOURCES
- Descriptors DEC
- ELEMENTS; ENERGY RANGE; FLUIDS; GASES; INDUSTRIAL RADIOGRAPHY; KEV RANGE; MATERIALS TESTING; METALS; NONDESTRUCTIVE TESTING; NONMETALS; RADIATION SOURCES; RARE GASES; REFLECTION; TESTING
Optional Information
- Contract/Grant/Project number
- AC04-94AL85000
- Funding organization
- USDOE National Nuclear Security Administration (NNSA) (United States)
- Secondary number(s)
- SAND--2016-12387J; OSTIID--1340260