Dielectric properties of polycrystalline Cu-Zn ferrites at microwave frequencies
Creators
- 1. Department of Physics, Kuvempu University, Shimoga, Shankarghatta 577451, Karnataka (India)
- 2. Departments of Studies in Physics, University of Mysore, Manasagangotri, Mysore 570006 (India)
- 3. Nano Material Science Division, Indian Institute of Technology (IIT) Madras, Chennai (India)
Description
Highlights: → Cu1-x ZnxFe2O4 at different concentration are suitable for high frequency applications. → Dielectric properties are related with W-H plot. → The anisotropy due to the crystallite size effect is significant in change of dielectric constant. - Abstract: The real dielectric constant ε' and complex dielectric constant ε'' of Cu1-xZnxFe2O4 have been measured at room temperature in the high frequency range 1 MHz to 1.8 GHz. At low frequencies the dielectric loss is found to be constant up to 1.4 GHz and there is a sudden rise at 1.5 GHz. A qualitative explanation is given for the composition, frequency dependence of the dielectric constant and dielectric loss of Cu1-xZnx Fe2O4. These are correlated with the W-H plot which gives the information about change in the average crystal size and strain of the samples. The micro-morphological features of the samples were obtained by Scanning Electron Microscopy (SEM). The micrograph shows that the increase of the Zn content in Cu ferrite increases the grain size.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2011.02.132Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2011.02.132;
- PII
- S0925-8388(11)00497-X;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 509
- Journal Issue
- 18
- Journal Page Range
- p. 5692-5695
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43011023
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIELECTRIC MATERIALS; FERRITE; FERRITES; FREQUENCY DEPENDENCE; GRAIN SIZE; MICROWAVE RADIATION; PERMITTIVITY; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SOLIDS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CRYSTALS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FERRIMAGNETIC MATERIALS; IRON ALLOYS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SIZE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.