An efficient solution for correlative microscopy and co-localized observations based on multiscale multimodal machine-readable nanoGPS tags
Creators
- 1. HORIBA France SAS, 14 Boulevard Thomas Gobert, Passage Jobin Yvon, Palaiseau 91120 (France)
- 2. Institut Photovoltaïque d'Ile de France (IPVF), 18 Boulevard Thomas Gobert, Palaiseau 91120 (France)
- 3. HORIBA France SAS, 231 rue de Lille, 59650 Villeneuve-d'Ascq (France)
Description
For a long time, investigating the same regions of interest of a sample with different instruments has been recognized as a very useful approach in various scientific fields. This paper presents an original solution for spotting the same points of interest with a high degree of accuracy and simplicity using different microscopes. It is based on small patterned tags fixed to the samples or their substrates. The patterns include an image-based position-sensing technology, for which an image of a small part of the tag can be automatically converted to absolute coordinates and angular orientation. Taking a single snapshot of the tag with an imaging instrument provides a correspondence between the sample and the coordinates of the moving stage. Co-localized observations performed with scanning electron microscopes, optical microscopes, and Raman microscopes are presented. The accuracy is in the range of a few µm up to 20 µm, which is generally sufficient to remove any ambiguity between the observed objects. The different contributions to colocalization errors are investigated experimentally and it is shown that errors related to the tags are negligible and that the main source of error is related to the accuracy of the moving stages integrated into the microscopes. A straightforward estimation of the relocalization error can be performed. It is believed that this solution will save researchers time and facilitate cooperation between laboratories. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/abce39Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 32
- Journal Issue
- 4
- Journal Page Range
- [17 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53045996
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; COOPERATION; COORDINATES; ERRORS; OPTICAL MICROSCOPES; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SUBSTRATES
- Descriptors DEC
- DISPERSIONS; ELECTRON MICROSCOPY; HOMOGENEOUS MIXTURES; MICROSCOPES; MICROSCOPY; MIXTURES