Application of third generation synchrotron source to studies of non-crystalline materials: In-Se amorphous films

The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60 and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In50Se50 and Se-In and Se-Se correlations for In40Se60 and In34Se66 within the first coordination sphere. (author)