Published 1992
| Version v1
Journal article
Determination of microimpurities of Ba, Ga, Mg, Mn, Si and Pb in high pure cadmium and tellurium
Description
Chemico-spectral method of determination of (2-6)x10-7 % Ba, Cd, Ga, Mg, Pb and Si, 4x10-8 % Mn in high-purity cadmium and tellurium after extraction-chromatographic isolation of the base was suggested. Graphite powder with CaF2 (5 %) addition serves as collector for microimpurities. The concentrates are analyzed by atomic-emission method in the direct current arc. Relative standard deciations do not exceed 0.1-0.28. The number of the elements determined can be extended
Additional details
Additional titles
- Original title (Russian)
- Определение микропримесей Ба, Га, Мн, Мг, Си, Пб в высокочистых кадмии и теллуре
Publishing Information
- Journal Title
- Vestnik Moskovskogo Universiteta, Seriya 2. Khimiya
- Journal Volume
- 33
- Journal Issue
- 3
- Journal Page Range
- p. 285-287.
- ISSN
- 0579-9384
- CODEN
- VMUKA5
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 24031907
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACCURACY; ALKALINE EARTH METAL COMPOUNDS; CADMIUM; EMISSION SPECTROSCOPY; GALLIUM COMPOUNDS; IMPURITIES; LEAD COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; SILICON COMPOUNDS; TELLURIUM
- Descriptors DEC
- CHEMICAL ANALYSIS; ELEMENTS; METALS; SEMIMETALS; SPECTROSCOPY