High-purity germanium crystal growing
Description
The germanium crystals used for the fabrication of nuclear radiation detectors are required to have a purity and crystalline perfection which is unsurpassed by any other solid material. These crystals should not have a net electrically active impurity concentration greater than 1010cm-3 and be essentially free of charge trapping defects. Such perfect crystals of germanium can be grown only because of the highly favorable chemical and physical properties of this element. However, ten years of laboratory scale and commercial experience has still not made the production of such crystals routine. The origin and control of many impurities and electrically active defect complexes is now fairly well understood but regular production is often interrupted for long periods due to the difficulty of achieving the required high purity or to charge trapping in detectors made from crystals seemingly grown under the required conditions. The compromises involved in the selection of zone refining and crystal grower parts and ambients is discussed and the difficulty in controlling the purity of key elements in the process is emphasized. The consequences of growing in a hydrogen ambient are discussed in detail and it is shown how complexes of neutral defects produce electrically active centers
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE83004181.Files
14762100.pdf
Files
(318.9 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:87aa9a5489c35ee5746b7a5da929ea28
|
318.9 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 17 p.
- Report number
- LBL--14916
Conference
- Title
- 6. international symposium on the scientific basis for radioactive waste management.
- Dates
- 1 - 4 Nov 1982.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14762100
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DEFECTS; CRYSTAL GROWTH; FABRICATION; GERMANIUM; HIGH-PURITY GE DETECTORS; IMPURITIES; PURIFICATION; ZONE REFINING
- Descriptors DEC
- CRYSTAL STRUCTURE; ELEMENTS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; REFINING; SEMICONDUCTOR DETECTORS; SEPARATION PROCESSES
Optional Information
- Secondary number(s)
- CONF-821107--39.