Published 1980
| Version v1
Book
Electron scattering by gas in HVEM at energies between 0.5 MeV and 2.5 MeV
- 1. Centre National de la Recherche Scientifique, 31 - Toulouse (France). Lab. d'Optique Electronique
Description
The problem of observing sensitive materials in electron microscopy is not fully resolved at the time being. One of the questions in biology is the possibility of doing experiments with hydrated samples. The authors have chosen to test a given type of environmental cell; it is transparent to electrons. The gas pressure is maintained by differential pumping. In order to establish the conditions in which images should be obtainable with good contrast and resolution, they have determined the partial electron scattering cross-sections with several gases at different pressures. (Auth.)
Additional details
Publishing Information
- Publisher
- Seventh European Congress on Electron Microscopy Foundation.
- Imprint Place
- Leiden (Netherlands)
- ISBN
- 90-9000149-2
- Imprint Title
- High voltage
- Imprint Pagination
- 456 p.
- Journal Page Range
- p. 74-77.
Conference
- Title
- 7. European congress on electron microscopy.
- Dates
- 24 - 29 Aug 1980.
- Place
- The Hague (Netherlands).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 14743881
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON MICROSCOPY; ELECTRON-ATOM COLLISIONS; GASES; KEV RANGE 100-1000; MEV RANGE 01-10; SCATTERING; TOTAL CROSS SECTIONS
- Descriptors DEC
- ATOM COLLISIONS; COLLISIONS; CROSS SECTIONS; ELECTRON COLLISIONS; ENERGY RANGE; FLUIDS; KEV RANGE; MEV RANGE; MICROSCOPY
Optional Information
- Notes
- Imprint:Distributed by North-Holland, Amsterdam, Netherlands.