Published 1980 | Version v1
Book

Electron scattering by gas in HVEM at energies between 0.5 MeV and 2.5 MeV

  • 1. Centre National de la Recherche Scientifique, 31 - Toulouse (France). Lab. d'Optique Electronique

Description

The problem of observing sensitive materials in electron microscopy is not fully resolved at the time being. One of the questions in biology is the possibility of doing experiments with hydrated samples. The authors have chosen to test a given type of environmental cell; it is transparent to electrons. The gas pressure is maintained by differential pumping. In order to establish the conditions in which images should be obtainable with good contrast and resolution, they have determined the partial electron scattering cross-sections with several gases at different pressures. (Auth.)

Additional details

Publishing Information

Publisher
Seventh European Congress on Electron Microscopy Foundation.
Imprint Place
Leiden (Netherlands)
ISBN
90-9000149-2
Imprint Title
High voltage
Imprint Pagination
456 p.
Journal Page Range
p. 74-77.

Conference

Title
7. European congress on electron microscopy.
Dates
24 - 29 Aug 1980.
Place
The Hague (Netherlands).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
14743881
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; ELECTRON-ATOM COLLISIONS; GASES; KEV RANGE 100-1000; MEV RANGE 01-10; SCATTERING; TOTAL CROSS SECTIONS
Descriptors DEC
ATOM COLLISIONS; COLLISIONS; CROSS SECTIONS; ELECTRON COLLISIONS; ENERGY RANGE; FLUIDS; KEV RANGE; MEV RANGE; MICROSCOPY

Optional Information

Notes
Imprint:Distributed by North-Holland, Amsterdam, Netherlands.