The new in-air micro-PIXE setup in Atomki, Debrecen
Creators
- Tòròk, Zs.1, 2
- Csedreki, L.1, 2
- Furu, E.1, 2
- Kertész, Z.S.3
- Huszánk, R.3
- Rajta, I.3
- Szikszai, Z.3
- Angyal, A.3
- Szoboszlai, Z.3
- Kiss, Á. Z.3
- Uzonyi, I.3
- Palcsu, L.3
- Universidade Federal do Rio Grande do Sul (UFRGS/IF/LLI), Porto Alegre, RS (Brazil). Inst. de Fisica. Lab. de Implantacao Ionica
- Sociedade Brasileira de Fisica, Sao Paulo, SP (Brazil)
- 1. University of Debrecen, Egyetem tér 1 (Hungary)
- 2. lnstitute of Nuclear Research of the Hungarian Academy of Sciences (Atomki), Laboratory of lon Beam Applications, Bem tér 18/c (Hungary)
- 3. lnstitute of Nuclear Research of the Hungarian Academyof Sciences (Atomki), Laboratory of lon Beam Applications, Bem tér 18/c (Hungary)
Description
Full text: In this work we present a new in-air micro-PIXE measurement setup installed at the Laboratory of lon Beam Applications of Atomki, Debrecen, Hungary. The new external measurement system was set up on the nuclear microprobe beamline. An external beam add-on system by Oxford Microbeams was mounted on the already existing microprobe vacuum chamber. The samples are positioned by using a digital microscope, two alignment lasers and a precision XYZ stage. The measurement system is equipped with two X-ray detectors for PIXE analysis, a surface barrier detector for RBS and a HP-Ge detector for γy-ray detection. The arrangement permits the combination of these techniques either simultaneously or separately, too. The beam current is measured with a beam chopper placed in the vacuum chamber. Exit windows with different thickness and of different materials can be used according to the actual demands. At the moment kapton foils of 8 μm thicknesses and silicon nitride (Si3N4) films with 100 nm, 200 nm and 500 nm thicknesses are at our disposal. The thickness, density and composition of the window materials were measured by profilometry and by RBS, STIM and PIXE in order to check whether the parameters provided by the producers were real. The capability of the new in-air micro-PIXE setup was demonstrated on standard reference materials and on geological (a stalactite) and archaeological samples. (author)
Availability note (English)
Available in abstract form only; full text entered in this recordAdditional details
Publishing Information
- Imprint Pagination
- 1 p.
Conference
- Title
- 13. International conference on particle-induced X-ray emission. For technology and global development
- Acronym
- PIXE 2013
- Dates
- 3-8 Mar 2013
- Place
- Gramado, RS (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 47061422
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BEAM CURRENTS; BEAM PULSERS; FOILS; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; ION MICROSCOPY; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAMPLERS; SILICON NITRIDES; SURFACE BARRIER DETECTORS; X-RAY DETECTION
- Descriptors DEC
- CHEMICAL ANALYSIS; CURRENTS; DETECTION; ELECTROMAGNETIC RADIATION; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; PNICTIDES; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SILICON COMPOUNDS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS