Published 2013 | Version v1
Miscellaneous

The new in-air micro-PIXE setup in Atomki, Debrecen

  • 1. University of Debrecen, Egyetem tér 1 (Hungary)
  • 2. lnstitute of Nuclear Research of the Hungarian Academy of Sciences (Atomki), Laboratory of lon Beam Applications, Bem tér 18/c (Hungary)
  • 3. lnstitute of Nuclear Research of the Hungarian Academyof Sciences (Atomki), Laboratory of lon Beam Applications, Bem tér 18/c (Hungary)

Description

Full text: In this work we present a new in-air micro-PIXE measurement setup installed at the Laboratory of lon Beam Applications of Atomki, Debrecen, Hungary. The new external measurement system was set up on the nuclear microprobe beamline. An external beam add-on system by Oxford Microbeams was mounted on the already existing microprobe vacuum chamber. The samples are positioned by using a digital microscope, two alignment lasers and a precision XYZ stage. The measurement system is equipped with two X-ray detectors for PIXE analysis, a surface barrier detector for RBS and a HP-Ge detector for γy-ray detection. The arrangement permits the combination of these techniques either simultaneously or separately, too. The beam current is measured with a beam chopper placed in the vacuum chamber. Exit windows with different thickness and of different materials can be used according to the actual demands. At the moment kapton foils of 8 μm thicknesses and silicon nitride (Si3N4) films with 100 nm, 200 nm and 500 nm thicknesses are at our disposal. The thickness, density and composition of the window materials were measured by profilometry and by RBS, STIM and PIXE in order to check whether the parameters provided by the producers were real. The capability of the new in-air micro-PIXE setup was demonstrated on standard reference materials and on geological (a stalactite) and archaeological samples. (author)

Availability note (English)

Available in abstract form only; full text entered in this record

Additional details

Publishing Information

Imprint Pagination
1 p.

Conference

Title
13. International conference on particle-induced X-ray emission. For technology and global development
Acronym
PIXE 2013
Dates
3-8 Mar 2013
Place
Gramado, RS (Brazil)