Published 1985
| Version v1
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Superficial deformations determination in silicon monocrystals by X-ray difraction
Description
We present a technique of determination of deformation distribution in monocrystal surfaces through the adjustement of Bragg reflection patterns obtained from the X-ray diffraction theory. (M.W.O.)
Availability note (English)
MF available from INIS under the Report Number.Abstract (Portuguese)
Apresenta-se uma tecnica de determinacao de distribuicoes de deformacao superficial em monocristais atraves do ajuste de perfis de reflexao Bragg obtidos a partir da teoria de difracao de raios-X. (M.W.O.)Files
20018274.pdf
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Additional details
Additional titles
- Original title (Portuguese)
- Determinacao de deformacoes superficiais em monocristais de silicio por difracao de raios-X
Publishing Information
- Imprint Pagination
- 120 p.
- Report number
- INIS-BR--1402
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 20018274
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- BRAGG REFLECTION; CRYSTAL LATTICES; CZOCHRALSKI METHOD; DIFFRACTOMETERS; OPTICAL PROPERTIES; SILICON COMPLEXES; SURFACE PROPERTIES
- Descriptors DEC
- COMPLEXES; CRYSTAL STRUCTURE; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; REFLECTION