Nanostructure formation on tungsten exposed to low-pressure rf helium plasmas: A study of ion energy threshold and early stage growth
- 1. University of California at San Diego, CA 92093-0417 (United States)
Description
Nanostructure formation on W targets is explored as a function of He+ impact energy, εi, in the range 20 ≤ εi ≤ 57 eV. Six targets are exposed at 1120 K for 6 h to pure He plasmas, generated by a low-pressure rf Helicon source. One target is additionally exposed to Ar plasma pre-treatment. It is found that He ions of impact energy 32-37 eV are necessary for nanostructure formation to be observed in this type of plasma, as determined by SEM. At 57 eV a nanostructured surface forms readily (similar to that observed by Baldwin and Doerner, Nuclear Fusion 48 (2008) 035001 in the PISCES-B device), but growth is retarded in the Ar pre-treatment case. Thermal desorption shows that nanostructuring is accompanied by increased trapping of He in degenerate vacancies and clusters, but is reduced by a factor of 8 as a result of Ar pre-treatment.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2010.10.050Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2010.10.050;
- PII
- S0022-3115(10)00643-4;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 415
- Journal Issue
- 1,Suppl
- Journal Page Range
- p. S104-S107
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 19. international conference on plasma-surface interactions in controlled fusion
- Dates
- 24-28 May 2010
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43056937
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESORPTION; HELIUM; HELIUM IONS; NANOSTRUCTURES; PLASMA; SCANNING ELECTRON MICROSCOPY; TUNGSTEN
- Descriptors DEC
- CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; GASES; IONS; METALS; MICROSCOPY; NONMETALS; RARE GASES; REFRACTORY METALS; SORPTION; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.