Möllenstedt biprism based shearing ptychographic iterative engine method
- 1. Computational Optics Laboratory, Department of Optoelectric Information Science and Technology, School of Science, Jiangnan University, Wuxi, Jiangsu 214122 (China)
- 2. Division Soft Matter & Biophysics, Department of Physics & Astronomy, KU Leuven (Belgium)
- 3. Single Molecule Nanometry Laboratory (Sinmolab), Nanjing Agricultural University, Nanjing, Jiangsu, 210095 (China)
- 4. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800 (China)
Description
Highlights: • A newly designed möllenstedt biprism based shearing PIE method. • Simplifying the PIE imaging system. • Quantitatively provide sample amplitude and phase distributions with high precision. • Have potential application in the field of high energy electron beam imaging. -- Abstract: Since classical lensless ptychographic iterative engine (PIE) method can retrieve both the sample amplitude and phase distributions with high resolution, fast convergence speed and large field of view, it has been widely used in various applications especially in short wavelength imaging such as X-ray or electron beam fields. However, traditional PIE often requires mechanical illumination or sample scanning, inevitably complicating the imaging system. In order to simplify its system, we design a Möllenstedt biprism based shearing PIE method, which essentially utilizes the relative motion of the two deflected waves obtained by loading different voltages on the Möllenstedt biprism to scan the sample instead of the mechanical transverse scan in the classical PIE method. Numerical computations and experiments with visible light prove that the shearing PIE method can extract the sample amplitude and phase distributions from multiple shearing diffraction patterns with high accuracy and fast convergence speed even without knowing the precise Möllenstedt biprism information. Our results show that Möllenstedt biprism based shearing PIE is suitable for quantitative short wavelength imaging.
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2019.02.021;
- PII
- S0304399118304145;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 202
- Journal Page Range
- p. 57-67
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55050790
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; DIFFRACTION; ELECTRIC POTENTIAL; ELECTRON BEAMS; ILLUMINANCE; ITERATIVE METHODS; WAVELENGTHS; X RADIATION
- Descriptors DEC
- BEAMS; CALCULATION METHODS; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LEPTON BEAMS; PARTICLE BEAMS; RADIATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.