Published February 26, 2001
| Version v1
Journal article
Probing surface states of Cu/Ni thin films using x-ray absorption spectroscopy - article No. 113401
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 63
- Journal Page Range
- [10 p.]
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33047886
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; COPPER; INTERFACES; NICKEL; SURFACE AREA; THIN FILMS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ELEMENTS; FILMS; METALS; SPECTROSCOPY; SURFACE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Notes
- Journal Publication Date: February 26 2001
- Funding organization
- US Department of Energy (United States)
- Secondary number(s)
- LBNL/ALS--43749