Published March 1974
| Version v1
Journal article
Fine compensation of trapping centers in semiconductor films by metal islands
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Тонкая компенсация центров захвата в полупроводниковых пленках металлическими островками
Publishing Information
- Journal Title
- Fiz. Tekh. Poluprovodn.
- Journal Volume
- 8
- Journal Issue
- 3
- Series
- Fiz. Tekh. Poluprovodn.
- Journal Page Range
- 622-623
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 5134564
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- BISMUTH; CADMIUM SULFIDES; COATINGS; CRYSTAL DOPING; ELECTRIC CONTACTS; ELECTRON MICROSCOPY; ELECTRON MOBILITY; FILMS; INDIUM; MONOCRYSTALS; SILVER; TRAPS; WORK FUNCTIONS
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ELECTRICAL EQUIPMENT; ELEMENTS; INORGANIC PHOSPHORS; METALS; MICROSCOPY; MOBILITY; PARTICLE MOBILITY; PHOSPHORS; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- Published in summary form only; for English translation see the journal Sov. Phys. -Semicond.