Published April 2005 | Version v1
Journal article

Tunnel barrier fabrication on Si and its impact on a spin transistor

  • 1. Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom)
  • 2. Laboratoire de Physique des Materiaux, BP 239, 54506 Vandoeuvre les Nancy (France)
  • 3. INESC-MN, Rua Alves Redol No 9, 1000-029 Lisboa (Portugal)
  • 4. Department of Electronics, University of Southampton, Southampton SO17 1BJ (United Kingdom)
  • 5. Department of Physics, University of York, York YO10 5DD (United Kingdom)
  • 6. INESC-MN, Rua Alves Redol No 9, 1000-029 Lisbon (Portugal)

Description

The realization of many future spintronic devices requires efficient spin injection into semiconductor structures. Critical considerations include interfacial intermixing of the metallic components and oxygen with Si, and the conditions for Schottky barrier formation. Both impact the design of a silicon-based spin transistor, which tunnel-injects carriers from a ferromagnetic emitter into the Si base and then tunnel-collects them via a ferromagnetic collector. A discussion of the characteristics of this spin tunnel transistor will be presented, including its behavior and magnetic sensitivity

Additional details

Identifiers

DOI
10.1016/j.jmmm.2004.11.443;
PII
S0304-8853(04)01704-4;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
290-291
Journal Page Range
p. 1383-1386
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
Joint European magnetic symposia
Acronym
JEMS '04
Dates
5-10 Sep 2004
Place
Dresden (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37026829
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; FABRICATION; OXYGEN; SEMICONDUCTOR MATERIALS; SENSITIVITY; SILICON; SPIN; TRANSISTORS
Descriptors DEC
ANGULAR MOMENTUM; ELEMENTS; MATERIALS; NONMETALS; PARTICLE PROPERTIES; SEMICONDUCTOR DEVICES; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.