Published April 2005
| Version v1
Journal article
Tunnel barrier fabrication on Si and its impact on a spin transistor
Creators
- 1. Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom)
- 2. Laboratoire de Physique des Materiaux, BP 239, 54506 Vandoeuvre les Nancy (France)
- 3. INESC-MN, Rua Alves Redol No 9, 1000-029 Lisboa (Portugal)
- 4. Department of Electronics, University of Southampton, Southampton SO17 1BJ (United Kingdom)
- 5. Department of Physics, University of York, York YO10 5DD (United Kingdom)
- 6. INESC-MN, Rua Alves Redol No 9, 1000-029 Lisbon (Portugal)
Description
The realization of many future spintronic devices requires efficient spin injection into semiconductor structures. Critical considerations include interfacial intermixing of the metallic components and oxygen with Si, and the conditions for Schottky barrier formation. Both impact the design of a silicon-based spin transistor, which tunnel-injects carriers from a ferromagnetic emitter into the Si base and then tunnel-collects them via a ferromagnetic collector. A discussion of the characteristics of this spin tunnel transistor will be presented, including its behavior and magnetic sensitivity
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.11.443;
- PII
- S0304-8853(04)01704-4;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 290-291
- Journal Page Range
- p. 1383-1386
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- Joint European magnetic symposia
- Acronym
- JEMS '04
- Dates
- 5-10 Sep 2004
- Place
- Dresden (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37026829
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; FABRICATION; OXYGEN; SEMICONDUCTOR MATERIALS; SENSITIVITY; SILICON; SPIN; TRANSISTORS
- Descriptors DEC
- ANGULAR MOMENTUM; ELEMENTS; MATERIALS; NONMETALS; PARTICLE PROPERTIES; SEMICONDUCTOR DEVICES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.