Published May 2009 | Version v1
Report Open

Development of high resolution X-ray semiconductor cryogenic detector and measurement method for material analysis

Creators

  • 1. KAERI, Daejeon (Korea, Republic of)

Description

This report studied present status of high resolution x-ray semiconductor cryogenic detector. The research scope and results are development of semiconductor cryogenic detector fabrication technology, cryogenic detection system, ultra high resolution cryogenic detector fabrication technology and semiconductor cryogenic detector.

Availability note (English)

Also available from KAERI

Files

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Additional details

Publishing Information

Imprint Pagination
119 p.
Report number
KAERI/RR--2999/2009

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
43041415
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CRYOGENICS; INSB SEMICONDUCTOR DETECTORS; RESOLUTION; SUPERCONDUCTORS
Descriptors DEC
MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
11 refs, 69 figs, 9 tabs