Dynamical simulation of tritium depth profile due to 130 keV D+ ion bombardment on a TiT target

The depth profiles of tritium atoms in a TiT target at liquid nitrogen temperature induced by 130 keV deuterium ion bombardment have been studied, using the hybrid Monte Carlo simulation code ACAT-DIFFUSE. The present ACAT-DIFFUSE code can estimate the slowing down process of incident ions and the thermal process of moderated atoms. It is found that the experimental depth profile is explained by the Doyle's local mixing model and the target expansion brought out by the accumulated deuterium atoms or recoil tritium atoms which cannot enter the interstitial sites. Another interesting feature is that the range of the implanted deuterium ion becomes shorter as the ion fluence increases. (author)