Published December 2012
| Version v1
Book
Characteristics of Si-PIN diode X-ray detector with DSP electronics
Creators
- 1. St. Xavier's College, Kolkata (India)
- 2. Saha Institute of Nuclear Physics, Kolkata (India)
- 3. Bengal Engineering and Science University, Howrah (India)
- 4. Indian Institute of Science Education and Research Kolkata, Mohanpur (India)
Description
In the present work, the studies to investigate the features of PIN diodes detector coupled with a digital processor have been extended. At low energies, backscattered Compton peaks are close in energy to photo peak of the gamma of interest. Thus the backscattered peaks pose a serious problem in the analysis of spectra of low energy gamma rays. It has been initiated some measurements to quantitatively estimate the same as function of energy and Z of the scatterer. Recently there has been application of backscattering in high-resolution gamma backscatter imaging for technical applications
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the DAE-BRNS symposium on nuclear physics. V. 57
- Imprint Pagination
- [973 p.]
- Journal Page Range
- p. 904-905
Conference
- Title
- 57. DAE-BRNS symposium on nuclear physics
- Dates
- 3-7 Dec 2012
- Place
- Delhi (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 44090384
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; COMPTON DIODE DETECTORS; HIGH-PURITY GE DETECTORS; PERFORMANCE; SILICON DIODES; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTRONIC EQUIPMENT; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES
Optional Information
- Notes
- 4 refs., 3 figs.