Published December 2012 | Version v1
Book

Characteristics of Si-PIN diode X-ray detector with DSP electronics

  • 1. St. Xavier's College, Kolkata (India)
  • 2. Saha Institute of Nuclear Physics, Kolkata (India)
  • 3. Bengal Engineering and Science University, Howrah (India)
  • 4. Indian Institute of Science Education and Research Kolkata, Mohanpur (India)

Description

In the present work, the studies to investigate the features of PIN diodes detector coupled with a digital processor have been extended. At low energies, backscattered Compton peaks are close in energy to photo peak of the gamma of interest. Thus the backscattered peaks pose a serious problem in the analysis of spectra of low energy gamma rays. It has been initiated some measurements to quantitatively estimate the same as function of energy and Z of the scatterer. Recently there has been application of backscattering in high-resolution gamma backscatter imaging for technical applications

Part of:
Proceedings of the DAE-BRNS symposium on nuclear physics. V. 57

Additional details

Publishing Information

Publisher
Bhabha Atomic Research Centre
Imprint Place
Mumbai (India)
Imprint Title
Proceedings of the DAE-BRNS symposium on nuclear physics. V. 57
Imprint Pagination
[973 p.]
Journal Page Range
p. 904-905

Conference

Title
57. DAE-BRNS symposium on nuclear physics
Dates
3-7 Dec 2012
Place
Delhi (India)

Optional Information

Notes
4 refs., 3 figs.