Published March 2020
| Version v1
Journal article
Atomic Force Microscopy Determination of the Direction of Dislocation Lines in Single Crystals of Bismuth and Its Alloys
Description
A technique for determining the directions of dislocation lines using an atomic force microscope after selective etching of a single crystal is discussed. The technique has been tested on bismuth-type single crystals.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 65
- Journal Issue
- 2
- Journal Page Range
- p. 211-214
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55060781
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; ATOMIC FORCE MICROSCOPY; BINARY ALLOY SYSTEMS; BISMUTH; BISMUTH OXIDES; DISLOCATIONS; EDGE DISLOCATIONS; ELECTRON MICROSCOPES; ETCHING; MEASURING METHODS; MONOCRYSTALS; ORIENTATION; SCREW DISLOCATIONS; TERNARY ALLOY SYSTEMS; VANADIUM ALLOYS
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; BISMUTH COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DISLOCATIONS; ELEMENTS; LINE DEFECTS; METALS; MICROSCOPES; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SURFACE FINISHING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2020 © Pleiades Publishing, Inc. 2020