The influence of DC biasing on the uniformity of a-C:H films for three-dimensional substrates by using a plasma-based ion implantation technique
Description
Amorphous hydrogenated carbon (a-C:H) films were synthesized by the use of a PBII technique using an electron cyclotron resonance plasma source with a mirror field, and the influence of the biasing conditions on the properties and the uniformity of the three-dimensional surfaces of a-C:H films was investigated. For convex faces, the film thickness was almost constant, independent of the deposition conditions, because a uniform plasma surrounded the substrates. For concave faces, the thickness of the films that formed without biasing and with only the application of a pulse bias decreased when the microwave-incident angle was decreased. On the other hand, when a DC bias was applied to the substrate in addition to a pulse bias, the uniformity of the thickness was much improved with a distribution within ±10%. The improvement in the uniformity was assumed to be the result of the continuous supply of ions in the plasma to the surfaces by the DC biasing
Additional details
Identifiers
- PII
- S0168583X03008723;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 206
- Journal Issue
- 1-4
- Journal Page Range
- p. 726-730
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on ion beam modification of materials
- Dates
- 1-6 Sep 2002
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Egypt
- INIS RN
- 35049546
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; CARBON; ELECTRON CYCLOTRON-RESONANCE; FILMS; HYDROGENATION; ION IMPLANTATION; PLASMA; SUBSTRATES; SURFACE COATING; SYNTHESIS; THICKNESS
- Descriptors DEC
- CHEMICAL REACTIONS; CYCLOTRON RESONANCE; DEPOSITION; DIMENSIONS; ELEMENTS; NONMETALS; RESONANCE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.