Published May 2003 | Version v1
Journal article

The influence of DC biasing on the uniformity of a-C:H films for three-dimensional substrates by using a plasma-based ion implantation technique

Description

Amorphous hydrogenated carbon (a-C:H) films were synthesized by the use of a PBII technique using an electron cyclotron resonance plasma source with a mirror field, and the influence of the biasing conditions on the properties and the uniformity of the three-dimensional surfaces of a-C:H films was investigated. For convex faces, the film thickness was almost constant, independent of the deposition conditions, because a uniform plasma surrounded the substrates. For concave faces, the thickness of the films that formed without biasing and with only the application of a pulse bias decreased when the microwave-incident angle was decreased. On the other hand, when a DC bias was applied to the substrate in addition to a pulse bias, the uniformity of the thickness was much improved with a distribution within ±10%. The improvement in the uniformity was assumed to be the result of the continuous supply of ions in the plasma to the surfaces by the DC biasing

Additional details

Identifiers

PII
S0168583X03008723;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
206
Journal Issue
1-4
Journal Page Range
p. 726-730
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
13. international conference on ion beam modification of materials
Dates
1-6 Sep 2002
Place
Kobe (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Egypt
INIS RN
35049546
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMORPHOUS STATE; CARBON; ELECTRON CYCLOTRON-RESONANCE; FILMS; HYDROGENATION; ION IMPLANTATION; PLASMA; SUBSTRATES; SURFACE COATING; SYNTHESIS; THICKNESS
Descriptors DEC
CHEMICAL REACTIONS; CYCLOTRON RESONANCE; DEPOSITION; DIMENSIONS; ELEMENTS; NONMETALS; RESONANCE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.