Direct electrocaloric measurement of 0.9Pb(Mg_1/3Nb_2/3)O₃-0.1PbTiO₃ films using scanning thermal microscopy

We show that scanning thermal microscopy can measure reversible electrocaloric (EC) effects in <40 μm-thick ceramic films of the relaxor ferroelectric 0.9Pb(Mg_1/3Nb_2/3)O₃-0.1PbTiO₃, with the substrate present. We recorded roughly the same non-adiabatic temperature change (±0.23 K) for a thinner film that was driven harder than a thicker film (±31 V μm⁻¹ across 13 μm versus ±11 V μm⁻¹ across 38 μm), because the thicker film lay relatively closer to the substantially larger adiabatic values that we predicted by thermodynamic analysis of electrical data. Film preparation was compatible with the fabrication of EC multilayer capacitors, and therefore our measurement method may be exploited for rapid characterisation of candidate films for cooling applications