Published June 1973
| Version v1
Journal article
X-ray microspectral investigation into solid solutions in Y2O3-HfO2-SiO2 system
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Микрорентгеноспектральное исследование твердых растворов в системе Ы
Publishing Information
- Journal Title
- Zh. Prikl. Khim.
- Journal Volume
- 46
- Journal Issue
- 6
- Series
- Zh. Prikl. Khim.
- Journal Page Range
- 1340-1342
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 4088276
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- DISTRIBUTION; HAFNIUM OXIDES; MICROSTRUCTURE; SILICON OXIDES; SOLID SOLUTIONS; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; DISPERSIONS; HAFNIUM COMPOUNDS; MIXTURES; OXIDES; SCATTERING; SILICON COMPOUNDS; SOLUTIONS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Notes
- Short communication only. For English translation see the journal J. Appl. Chem. USSR.