Published November 1, 2012 | Version v1
Journal article

Electroluminescence properties of In-doped Zn2SiO4 thin films prepared by sol-gel process

  • 1. Department of Vehicle and Mechanical Engineering, Faculty of Science and Technology, Meijo University, 1-501 Shiogamaguchi Tempaku-ku, Nagoya 468-8502 (Japan)
  • 2. Technical Administration Division, KICTEC INC., 150 Umegaoka, Usaka, Agui, Chita, Aichi 470-2295 (Japan)
  • 3. Department of Civil Engineering, Faculty of Science and Technology, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502 (Japan)

Description

The effect of In doping on the electroluminescence (EL) properties of Zn2SiO4:In thin films was investigated. In-doped Zn2SiO4 thin films were deposited on BaTiO3 substrates and their EL properties were characterized in this study. X-ray powder diffraction patterns of In-doped Zn2SiO4 powders revealed a single phase of Zn2SiO4 for In concentrations up to approximately 1.5 mol%, whereas a secondary phase of In2O3 was observed for In concentrations in the range of 2-10 mol%. The maximum luminance of thin film electroluminescent (TFEL) devices varied significantly with the amount of In doping. The highest luminance with blue emission was obtained when 2 mol% In was doped. The blue emission of In-doped Zn2SiO4 thin film may be related to the In substitution for Zn. The 2 mol% In-doped Zn2SiO4 thin film exhibited blue emission with CIE color coordinates of x=0.208 and y=0.086.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2012.07.023

Additional details

Identifiers

DOI
10.1016/j.physb.2012.07.023;
PII
S0921-4526(12)00708-9;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
407
Journal Issue
21
Journal Page Range
p. 4308-4312
ISSN
0921-4526
CODEN
PHYBE3

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.