Published July 1, 2017 | Version v1
Journal article

Prominent role of indirect processes in electron-impact ionization of Xe24+ ions

  • 1. Department of Physics, College of Science, National University of Defense Technology, Changsha Hunan (China)
  • 2. I. Physikalisches Institut, Justus-Liebig-Universität Gießen, 35392 Giessen (Germany)
  • 3. Institut für Atom- und Molekülphysik, Justus-Liebig-Universität Gießen, 35392 Giessen (Germany)

Description

The cross section for electron-impact single ionization of Xe24+ has been studied both experimentally and theoretically. The cross section exhibits significant features from resonant ionization processes such as resonant-excitation double autoionization. These are well described by the theoretical calculations if the latter take into account excitations to atomic shells with principal quantum numbers of up to n = 39. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/875/6/052048

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
875
Journal Issue
6
Journal Page Range
[1 p.]
ISSN
1742-6596

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49061553
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
AUTOIONIZATION; CROSS SECTIONS; ELECTRON-ATOM COLLISIONS; ELECTRONIC STRUCTURE; ELECTRONS; EXCITATION; MULTICHARGED IONS; QUANTUM NUMBERS; SIMULATION; XENON IONS
Descriptors DEC
ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELEMENTARY PARTICLES; ENERGY-LEVEL TRANSITIONS; FERMIONS; IONIZATION; IONS; LEPTONS