Published July 1, 2017
| Version v1
Journal article
Prominent role of indirect processes in electron-impact ionization of Xe24+ ions
- 1. Department of Physics, College of Science, National University of Defense Technology, Changsha Hunan (China)
- 2. I. Physikalisches Institut, Justus-Liebig-Universität Gießen, 35392 Giessen (Germany)
- 3. Institut für Atom- und Molekülphysik, Justus-Liebig-Universität Gießen, 35392 Giessen (Germany)
Description
The cross section for electron-impact single ionization of Xe24+ has been studied both experimentally and theoretically. The cross section exhibits significant features from resonant ionization processes such as resonant-excitation double autoionization. These are well described by the theoretical calculations if the latter take into account excitations to atomic shells with principal quantum numbers of up to n = 39. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/875/6/052048Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 875
- Journal Issue
- 6
- Journal Page Range
- [1 p.]
- ISSN
- 1742-6596
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49061553
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- AUTOIONIZATION; CROSS SECTIONS; ELECTRON-ATOM COLLISIONS; ELECTRONIC STRUCTURE; ELECTRONS; EXCITATION; MULTICHARGED IONS; QUANTUM NUMBERS; SIMULATION; XENON IONS
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELEMENTARY PARTICLES; ENERGY-LEVEL TRANSITIONS; FERMIONS; IONIZATION; IONS; LEPTONS