Published April 30, 2010 | Version v1
Journal article

Study of copper electrodeposition mechanism from a strike alkaline bath prepared with 1-hydroxyethane-1,1-diphosphonic acid through cyclic voltammetry technique

  • 1. Metallurgy and Materials Engineering Department, EPUSP-University of Sao Paulo, Av. Prof. Luciano Gualberto, N. 380, 05508-900, Sao Paulo, SP (Brazil)
  • 2. Corrosion and Protection Laboratory, Center for Integrity of Structures and Equipment, Institute for Technological Research, Av. Prof. Almeida Prado, N. 532, 05508-901, Sao Paulo, SP (Brazil)

Description

Copper strike baths are extensively used in metal plating industry as they present the ability to plate adherent copper layers on less-noble metal substrates such as steel and zinc die castings. However, in the last few years, due to environmental controls and safety policies for operators, the plating industry has been interested in replacing the toxic cyanide copper strike baths with environmentally friendly baths. A broad bibliographic review showed that the published papers, referring to the new nontoxic copper strike baths, are patents, having little or no emphasis focused on electrodeposition mechanisms. Therefore, it was decided to study the copper electrodeposition mechanism from a strike alkaline bath prepared with one of the most nontoxic chelating agents cited in many patents which is the 1-hydroxyethane-1,1-diphosphonic acid, known as HEDP. This acid forms very stable water soluble complexes with Cu2+ ions, thus cupric sulfate was used for preparing the plating bath. The results obtained through a cyclic voltammetry technique showed that Cu2+ ion reduction to Cu from an HEDP electrodeposition bath occurs via a direct reduction reaction without a formation of Cu+ intermediates.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.electacta.2010.01.113

Additional details

Identifiers

DOI
10.1016/j.electacta.2010.01.113;
PII
S0013-4686(10)00211-2;

Publishing Information

Journal Title
Electrochimica Acta
Journal Volume
55
Journal Issue
12
Journal Page Range
p. 3870-3875
ISSN
0013-4686
CODEN
ELCAAV

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.