Published October 1977
| Version v1
Journal article
Projectile charge-state dependence of K-shell ionization by silicon ions: A comparison of Coulomb ionization theories for direct ionization and electron capture with x-ray production data
- 1. Department of Physics, North Texas State University, Denton, Texas 76203
Description
X-ray-production cross sections measured in K-shell ionization of 21Sc, 22Ti, 29Cu, and 32Ge by 52-MeV 2814Si/sup [q/ projectiles with q = 7 to 14 are reported, which demonstrate, through their charge-state dependence, the validity of a recently developed electron-capture theory with a reduced binding effect. Furthermore, the data provide evidence for the applicability of the perturbed stationary-state theory of direct ionization for values of 0.44 < or = Z1/Z2 < or = 0.67
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review A
- Journal Volume
- 16
- Journal Issue
- 4
- Series
- Phys. Rev., A.
- Journal Page Range
- 1375-1378
- ISSN
- 0556-2791
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 9363906
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- COPPER; GERMANIUM; ION BEAMS; ION-ATOM COLLISIONS; IONIZATION; K SHELL; MEV RANGE 10-100; SILICON; SILICON IONS; TITANIUM; X-RAY SPECTRA
- Descriptors DEC
- ATOM COLLISIONS; ATOMIC IONS; BEAMS; CHARGED PARTICLES; COLLISIONS; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY RANGE; ION COLLISIONS; IONS; METALS; MEV RANGE; SEMIMETALS; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Notes
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