Microwave dielectric properties and sintering behavior of nano-scaled (α + θ)-Al2O3 ceramics
- 1. Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan (China)
- 2. Department of Resource Engineering, National Cheng Kung University, Tainan, Taiwan (China)
Description
The dielectric properties at microwave frequencies and the microstructures of nano (α + θ)-Al2O3 ceramics were investigated. Using the high-purity nano (α + θ)-Al2O3 powders can effectively increase the value of the quality factor and lower the sintering temperature of the ceramic samples. Grain growth can be limited with θ-phase Al2O3 addition and high-density alumina ceramics can be obtained with smaller grain size comparing to pure α-Al2O3. Relative density of sintered samples can be as high as 99.49% at 1400 deg. C for 8 h. The unloaded quality factors Q x f are strongly dependent on the sintering time. Further improvement of the Q x f value can be achieved by extending the sintering time to 8 h. A dielectric constant (εr) of 10, a high Q x f value of 634,000 GHz (measured at 14 GHz) and a temperature coefficient of resonant frequency (τf) of -39.88 ppm/deg. C were obtained for specimen sintered at 1400 deg. C for 8 h. Sintered ceramic samples were also characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM)
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2007.06.032Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2007.06.032;
- PII
- S0025-5408(07)00277-2;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 43
- Journal Issue
- 6
- Journal Page Range
- p. 1463-1471
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40023934
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; CERAMICS; CRYSTAL GROWTH; GHZ RANGE 01-100; GRAIN GROWTH; GRAIN SIZE; IMPURITIES; MICROWAVE RADIATION; PERMITTIVITY; QUALITY FACTOR; SCANNING ELECTRON MICROSCOPY; SINTERING; TEMPERATURE COEFFICIENT; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; FREQUENCY RANGE; GHZ RANGE; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REACTIVITY COEFFICIENTS; SCATTERING; SIZE
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.