Published 2005 | Version v1
Computer medium

Study of the inactive layer of a germanium detector: experimental and Monte Carlo simulation treatments

  • 1. Instituto de Pesquisas Energeticas e Nucleares (IPEN), Sao Paulo, SP (Brazil)
  • 2. Sao Paulo Univ., SP (Brazil). Inst. de Fisica
  • 3. Centro Regional de Ciencias Nucleares (CRCN), Recife, PE (Brazil)

Description

The detection efficiency of a Germanium detector was measured in the energy range of 80 keV up to 1 MeV. A model function to fit the efficiency data was used, containing an absorbing window factor. The results were compared with a Monte Carlo simulation of the photon interactions where, the nominal dimensions were varied in order to check the low-energy behavior of the efficiency curve. The Monte Carlo results showed to be in good agreement with the experimental ones when the nominal dimensions of the crystal, except for its dead layer thickness, were used. This difference in the dead layer was attributed to its non-uniformity. (author)

Part of:
Study of semiconductor detectors applied to diagnostic X-ray

Additional details

Publishing Information

ISBN
85-99141-01-5
Imprint Title
Proceedings of the INAC 2005: International nuclear atlantic conference. Nuclear energy reducing global warming; 14. Brazilian national meeting on reactor physics and thermal hydraulics; 7. Brazilian national meeting on nuclear applications
Imprint Pagination
[4886 p.]
Journal Page Range
[5 p.]

Conference

Title
International nuclear atlantic conference. Nuclear energy reducing global warming; 14. Brazilian national meeting on reactor physics and thermal hydraulics; 7. Brazilian national meeting on nuclear applications
Acronym
INAC 2005
Dates
28 Aug - 2 Sep 2005
Place
Santos, SP (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
36107392
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
COMPUTERIZED SIMULATION; E CODES; EFFICIENCY; EXPERIMENTAL DATA; GE SEMICONDUCTOR DETECTORS; MONTE CARLO METHOD
Descriptors DEC
CALCULATION METHODS; COMPUTER CODES; DATA; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION

Optional Information

Notes
3 refs., 2 figs., 1 tab. Code: 618.pdf Imprint:Published only in CD-Rom