Magnetic and electrical properties of layered magnets Tl(Cr,Mn,Co)Se2
- 1. National Academy of Sciences of Azerbaijan, Institute of Physics (Azerbaijan)
Description
Tl(Cr,Mn,Co)Se2 crystals were synthesized at T ∼ 1050 K. X-ray diffraction analysis showed that TlCrSe2, TlMnSe2, and TlCoSe2 compounds crystallize in the hexagonal crystal system with the lattice parameters: a = 3.6999 A, c = 22.6901 A, c/a ∼ 6.133, z = 3, ρx = 6.209 g/cm3; a = 6.53 A, c = 23.96 A, c/a ∼ 3.669, z = 8, ρx = 6.71 g/cm3; and a = 3.747 A, c = 22.772 A, c/a ∼ 6.077, z = 3, ρx = 7.577 g/cm3, respectively. Magnetic and electrical studies in the temperature range from 80-400 K showed that TlCrSe2 is a semiconductor ferromagnet, TlMnSe2 is a semiconductor antiferromagnet, and TlCoSe2 is a ferrimagnet with a conductivity characteristic of metals. A rather large deviation in the experimental effective magnetic moment for TlCrSe2 (3.05 μB) from the theoretical value (3.85 μB) is attributed to two-dimensional magnetic ordering in the paramagnetic region of the noticeably layered ferromagnet TlCrSe2. In TlCrSe2, a correlation between magnetic and electrical properties was detected.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 43
- Journal Issue
- 2
- Journal Page Range
- p. 152-155
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41011266
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM ALLOYS; COBALT ALLOYS; CORRELATIONS; CRYSTALS; ELECTRICAL PROPERTIES; LATTICE PARAMETERS; MAGNETIC MOMENTS; MAGNETIZATION; MAGNETS; MANGANESE ALLOYS; PARAMAGNETISM; SEMICONDUCTOR MATERIALS; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; THALLIUM ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; EQUIPMENT; MAGNETISM; MATERIALS; PHYSICAL PROPERTIES; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2009 Pleiades Publishing, Ltd.